Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 19mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 19mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences Grain Sizing Reticle NG60, 21 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 21 mm
Method: EN 10247
Electron Microscopy Sciences V-1 Quality, 20 mm diameter, 0.15- 0.21 mm thick
EMS Mica Sheets offer a clean surface for EM applications, carbon filming and particle spraying, as well as for AFM applications. There are two types of mica: muscovite and phlogopite. Generally, one differs from the other by color (Muscovite is Ruby, Green or White; Phlogopite is Amber, Yellow, or Silver). The maximum operating temperature for Muscovite is about 500-600 degree C and for Phlogopite is about 800-900 degree C. Our line consists of High Quality Muscovite Mica. This mica peels off very thin up to 0.0001" uniform layers, exposing "virgin" mica upon splitting.
Muscovite, potash type mica, sometimes known as granitic mica, is the best of all micas in dielectric strength, perfection of cleavage, and transparency. It has the chemical formula: H2KAI3(Si04)3. Clear. Hard, of uniform color, nearly flat, free of all stains, foreign inclusion, cracks, and other similar defects.
Quality: V-1
Size: 20 mm dia
Thickness: 0.15- 0.21 mm
Electron Microscopy Sciences Formvar/Carbon Support Film 5-6 nm/1 nm thick on 2X1 mm Slot Grid Gold Grid
A formvar coated grid, stabilized with evaporated carbon film. This type of coating is excellent for specimen support, especially for ultra thin sections. Coated grids are optically checked followed by batch testing in the electron microscope. Packed in grid storage box. NOTE: All film is laid on the shiny side of the grid. Formvar is 5-6 nm thick with a 1 nm carbon coating.
Grid: Gold
Electron Microscopy Sciences Crossed Scale Microscope Graticle NE17, 20.4 mm, 10 mm with 0.1 mm subdivisions
Used as a horizontal and a vertical scale, they are especially useful when interested in measurement in different axis. Crossed micrometer scale.
Size: 20.4 mm
Divisions: 10 mm with 0.1 mm subdivisions
Surface: Chrome image
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 21mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 21mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences Grid Reticle RET 73, 19 mm, 10 mm x 10 mm Scale, 1 mm squares Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 10 mm x 10 mm
Divisions: 1 mm squares
Line width: 25 µm
Electron Microscopy Sciences Indexed Grid Graticle NE71, 24 mm, 20 x 20 Grid of 0.5 mm squares
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Index Pattern.
Size: 24 mm
Divisions: 20 x 20 Grid of 0.5 mm squares
Electron Microscopy Sciences Cross Lines Graticle NE81, 21 mm, Nominal line width 0.040 mm
Used as NE50 but for measurements in two directions and for sighting and alignment. Image covers the entire field of view.
Size: 21 mm
Divisions: Nominal line width 0.040 mm
Surface: Chrome image
Electron Microscopy Sciences EMS Calibration Micrometer Model ACM-1
This ideal standard provides accurate calibration of any eyepiece, reticules, filar micrometers, or electronic measuring instrument. Features a series of ʽH' shaped fiducial images in a range of sizes from 0.1 mm through 20 mm, useful for calibration range from 1X to 1000X power.
Electron Microscopy Sciences Omniprobe Lift-Out Grids for in-situ FIB, Copper
Custom copper lift-out grids specifically designed for in-situ lift-out. These grids include multiple indexed mounting locations with both vertical bars and "V" shaped attachment surfaces. 3 mm diameter
Material: Copper
Electron Microscopy Sciences Reference Stage Graticule 75 mmx25 mm Slide
High precision image analysis standard provides four test areas for calibrating image analysis systems and identifying deviations and distortions in optical imaging systems. It is produced on a 75 mm x 25 mm slide and has a square grid accuracy of +/-0.1um and a dot accuracy of +/-0.3um.
The four test areas are:
400 um x 400 um square grid subdivided into 200, 100, 50 and 25 micron squares for detecting gross image distortions and can be used as an accurate two dimensional stage micrometer.
A 20 x 17 array of nominally 15 um diameter dots is used to identify lens distortions.
A root-2 array of spots from 3 um to 48 um diameter is used for determining the threshold levels of cameras and microscopes.
A log-normal distribution array of 100 spots ranging from 4.5 um to 27 um diameter enables the mean and standard deviation to be determined and compared with certified values. This is an idealized distribution of maximum dynamic range for a full screen.
Electron Microscopy Sciences Calibration Specimen 750-HD, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. AFM, SEM, product: 750-HD, pattern: array of flat bumps, nominal pitch: 750 (x), Z (100), material: Ni.
Mount: Unmounted
Electron Microscopy Sciences Calibration Specimen 700-2D, Unmounted
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. 700-2D, pattern: array of posts, nominal pitch: 700 nm, material: W-coated photoresist on Si.
Mount: Unmounted
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 400
Material: Copper